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Research Article
Vol. 11, Issue 1, 2013April 01, 2013 CEST

Evaluation of Uncertainties in Measurement of Isotopic Abundance by Semi-quantitative Analysis with TOF-SIMS

S. Narita, K. Neichi, T. Matsumoto,
Isotopic abundanceMetal deuterideSurface morphologyTOF-SIMSTransmutation
https://doi.org/10.70923/001c.72219
JCMNS
Narita, S., K. Neichi, and T. Matsumoto. 2013. “Evaluation of Uncertainties in Measurement of Isotopic Abundance by Semi-Quantitative Analysis with TOF-SIMS.” Journal of Condensed Matter Nuclear Science 11 (1): 93–100. https:/​/​doi.org/​10.70923/​001c.72219.
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